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Optimization of FIB–SEM Tomography and Reconstruction for Soft, Porous, and Poorly Conducting Materials
Microscopy and Microanalysis ( IF 2.9 ) Pub Date : 2020-05-22 , DOI: 10.1017/s1431927620001592 Cecilia Fager 1 , Magnus Röding 2 , Anna Olsson 3 , Niklas Lorén 1, 2 , Christian von Corswant 3 , Aila Särkkä 4 , Eva Olsson 1
中文翻译：
FIB-SEM 断层扫描的优化和软质、多孔和不良导电材料的重建
Microscopy and Microanalysis ( IF 2.9 ) Pub Date : 2020-05-22 , DOI: 10.1017/s1431927620001592 Cecilia Fager 1 , Magnus Röding 2 , Anna Olsson 3 , Niklas Lorén 1, 2 , Christian von Corswant 3 , Aila Särkkä 4 , Eva Olsson 1
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中文翻译：
FIB-SEM 断层扫描的优化和软质、多孔和不良导电材料的重建
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