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ToF-SIMS and AFM Characterization of Brown Cosmetic Contact Lenses: From Structural Analysis to the Identification of Pigments.
Journal of Analytical Methods in Chemistry ( IF 2.3 ) Pub Date : 2020-01-22 , DOI: 10.1155/2020/6134627
Seon Hee Kim 1 , Jihye Lee 1 , Yun Jung Jang 1, 2 , Kang-Bong Lee 3 , Yeonhee Lee 1
Affiliation  

Over the years, soft contact lenses for vision correction and cosmetic and therapeutic purposes have been greatly improved. For cosmetic contact lenses, the pigments need to be nontoxic, and the position of the pigment layer is particularly important because of the risks posed by pigment elution and the roughness of the lens surface. In this paper, we characterized the properties of brown cosmetic contact lenses made by three different manufacturers using surface analytical techniques. The surface topographies of the noncolored and colored parts were obtained by atomic force microscopy (AFM), and the position and composition of the pigment layer were determined by analyzing the cross section of the contact lenses using scanning electron microscopy with energy-dispersive X-ray spectroscopy (SEM-EDX). The influence of pigment location on surface roughness was also examined. In addition, to find the method of the evaluation for the risk of surface elution of the pigments in the colored parts, the mass spectra and ion images of the surfaces were obtained by time-of-flight secondary ion mass spectrometry (ToF-SIMS) with a new sample preparation. From the ToF-SIMS spectra, we observed specific fragment ions of the poly(hydroxyethyl methacrylate) (PHEMA) polymer and found differences in the composition of the pigment layer depending on the manufacturers. The cross-sectioned image and 3D chemical characterizations of metallic and specific ions in the brown cosmetic contact lenses clearly indicated the spatial distribution and location of the pigment layer that can be used for the evaluation of pigment elution.

中文翻译:

棕色化妆品隐形眼镜的ToF-SIMS和AFM表征:从结构分析到颜料识别。

多年来,用于视力矫正以及美容和治疗目的的软性隐形眼镜已经得到了很大的改进。对于化妆品隐形眼镜,颜料必须是无毒的,并且颜料层的位置特别重要,因为颜料洗脱和镜片表面粗糙会带来危险。在本文中,我们使用表面分析技术表征了三个不同制造商制造的棕色化妆品隐形眼镜的性能。通过原子力显微镜(AFM)获得无色和有色部分的表面形貌,并通过扫描电子显微镜和能量色散X射线分析隐形眼镜的横截面,确定颜料层的位置和组成光谱仪(SEM-EDX)。还检查了颜料位置对表面粗糙度的影响。另外,为了找到评估着色部分中颜料表面洗脱风险的方法,通过飞行时间二次离子质谱法(ToF-SIMS)获得了表面的质谱和离子图像。进行新的样品制备。从ToF-SIMS光谱中,我们观察到聚甲基丙烯酸羟乙酯(PHEMA)聚合物的特定碎片离子,并发现颜料层组成的差异取决于制造商。棕色化妆品隐形眼镜中金属离子和特定离子的横截面图像和3D化学特征清楚地表明了可用于评估颜料洗脱的颜料层的空间分布和位置。为了找到评估有色部件中颜料表面洗脱风险的方法,采用新的飞行时间二次离子质谱仪(ToF-SIMS)获得了表面的质谱和离子图像。样品制备。从ToF-SIMS光谱中,我们观察到聚甲基丙烯酸羟乙酯(PHEMA)聚合物的特定碎片离子,并发现颜料层组成的差异取决于制造商。棕色化妆品隐形眼镜中金属离子和特定离子的横截面图像和3D化学特征清楚地表明了可用于评估颜料洗脱的颜料层的空间分布和位置。为了找到评估有色部件中颜料表面洗脱风险的方法,采用新的飞行时间二次离子质谱仪(ToF-SIMS)获得了表面的质谱和离子图像。样品制备。从ToF-SIMS光谱中,我们观察到聚甲基丙烯酸羟乙酯(PHEMA)聚合物的特定碎片离子,并发现颜料层组成的差异取决于制造商。棕色化妆品隐形眼镜中金属离子和特定离子的横截面图像和3D化学特征清楚地表明了可用于评估颜料洗脱的颜料层的空间分布和位置。通过飞行时间二次离子质谱(ToF-SIMS)和新的样品制备获得了表面的质谱和离子图像。从ToF-SIMS光谱中,我们观察到聚甲基丙烯酸羟乙酯(PHEMA)聚合物的特定碎片离子,并发现颜料层组成的差异取决于制造商。棕色化妆品隐形眼镜中金属离子和特定离子的横截面图像和3D化学特征清楚地表明了可用于评估颜料洗脱的颜料层的空间分布和位置。通过飞行时间二次离子质谱(ToF-SIMS)和新的样品制备获得了表面的质谱和离子图像。从ToF-SIMS光谱中,我们观察到聚甲基丙烯酸羟乙酯(PHEMA)聚合物的特定碎片离子,并发现颜料层组成的差异取决于制造商。棕色化妆品隐形眼镜中金属离子和特定离子的横截面图像和3D化学特征清楚地表明了可用于评估颜料洗脱的颜料层的空间分布和位置。我们观察到聚甲基丙烯酸羟乙酯(PHEMA)聚合物的特定碎片离子,并发现颜料层组成的差异取决于制造商。棕色化妆品隐形眼镜中金属离子和特定离子的横截面图像和3D化学特征清楚地表明了可用于评估颜料洗脱的颜料层的空间分布和位置。我们观察到聚甲基丙烯酸羟乙酯(PHEMA)聚合物的特定碎片离子,并发现颜料层组成的差异取决于制造商。棕色化妆品隐形眼镜中金属离子和特定离子的横截面图像和3D化学特征清楚地表明了可用于评估颜料洗脱的颜料层的空间分布和位置。
更新日期:2020-01-22
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