This is the first in a series of articles which present a new framework for computing the standard uncertainty in electron excited X-ray microanalysis measurements. This article will discuss the framework and apply it to a handful of simple, but useful, subcomponents of the larger problem. Subsequent articles will handle more complex aspects of the measurement model. The result will be a framework in which sophisticated and practical models of the uncertainty for real-world measurements. It will include many long overlooked contributions like surface roughness and coating thickness. The result provides more than just error bars for our measurements. It also provides a framework for measurement optimization and, ultimately, the development of an expert system to guide both the novice and expert to design more effective measurement protocols.

中文翻译：

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拥抱不确定性：对电子探针显微分析中的标准不确定性进行建模——第一部分

这是一系列文章中的第一篇，这些文章提出了一个新框架，用于计算电子激发 X 射线微量分析测量中的标准不确定度。本文将讨论该框架并将其应用于较大问题的一些简单但有用的子组件。后续文章将处理测量模型的更复杂方面。结果将是一个框架，其中复杂且实用的不确定性模型可用于实际测量。它将包括许多长期被忽视的贡献，如表面粗糙度和涂层厚度。结果不仅为我们的测量提供了误差线。它还为测量优化提供了一个框架，并最终为专家系统的开发提供了指导，以指导新手和专家设计更有效的测量协议。