Spin Polarized Low Energy Electron Microscopy (SPLEEM) is a powerful tool to reveal the magnetic structure of ferromagnetic surfaces on the atomic depth scale level[1-3]. With aberration corrected LEEM and a high brightness spin polarized electron gun, high spatial resolution will provide more details for ultra-thin ferromagnetic film studies. This study reports the first realization of aberration corrected SPLEEM (AC-SPLEEM). The performance of the setup was tested on ferromagnetic Fe nanoscale islands on a W(110) single crystal, with spatial resolution of 3.3 nm in spin asymmetry images.

中文翻译：

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像差校正自旋偏振低能电子显微镜

自旋极化低能电子显微镜 (SPLEEM) 是在原子深度尺度水平上揭示铁磁表面磁性结构的有力工具[1-3]。使用像差校正 LEEM 和高亮度自旋极化电子枪，高空间分辨率将为超薄铁磁薄膜研究提供更多细节。该研究报告了像差校正 SPLEEM (AC-SPLEEM) 的首次实现。该装置的性能在 W(110) 单晶上的铁磁 Fe 纳米级岛上进行了测试，自旋不对称图像的空间分辨率为 3.3 nm。