当前位置: X-MOL 学术Phys. Solid State › 论文详情
Our official English website, www.x-mol.net, welcomes your feedback! (Note: you will need to create a separate account there.)
Temperature–Frequency Dependence of the Dielectric Response in LuFe 2 O 4 Multiferroics
Physics of the Solid State ( IF 0.9 ) Pub Date : 2020-05-20 , DOI: 10.1134/s1063783420050066
G. M. Gadzhiev , A. G. Gamzatov , R. A. Aliev , N. S. Abakarova , L. L. Emiraslanova , M. N. Markelova , A. R. Kaul’

Abstract

The temperature–frequency spectra of the complex dielectric permittivity of the LuFe2O4 multiferroics have been studied in the temperature range 100–400 K at frequencies 20 Hz–120 MHz. It is found that the temperature coefficient of the dielectric permittivity changes its sign and the ac conductivity has maxima and minima in the temperature range ~150–350 K and in the frequency range ~30–120 MHz. These specific features are due to independent resonance mechanisms: the coincidence of frequency of the measuring ac voltage with the frequency of electron jumps as the hopping conductivity takes place; the proximity of the measurement signal period to the time of formation of a barrier layer at the boundary of contact with the sample; and the approximation of the frequency of an ac external field to the frequency of the sample structural elements.


中文翻译:

LuFe 2 O 4多铁中介电响应的温度-频率依赖性

摘要

LuFe 2 O 4的复介电常数的温度-频谱在100 Hz至400 K的温度范围内,频率为20 Hz至120 MHz的情况下,对多铁性材料进行了研究。发现介电常数的温度系数改变其符号,并且交流电导率在〜150–350 K的温度范围和〜30–120 MHz的频率范围内具有最大值和最小值。这些特定的特征是由于独立的共振机制引起的:交流电压的测量频率与电子的频率随跳跃电导率的变化而一致;测量信号周期与在与样品接触的边界处形成阻挡层的时间的接近度;交流外部磁场的频率与样本结构元件的频率的近似值。
更新日期:2020-05-20
down
wechat
bug