This work refines surface registration methods for metrological datasets to improve the multi-method qualification accuracy of additively manufactured (AM) lattices. Datasets acquired from X-ray computed tomography and a coordinate measurement machine of an AM lattice were aligned using derived geometry datum features based on a theoretical supplemental surface definition, which has been established in recent draft standards, but has had limited examination using complex AM structures. A refined sampling registration approach for lattice geometry based on spatially-dependent subsampling is derived and shown to statistically decrease variation between measurement sources. This importance of well-defined sampling practice and definition is highlighted. The applicability of this approach for multi-method qualification of complex AM parts is discussed. This work lays the foundation of utilizing specifications under consideration in a new standard with possible verification techniques that can be employed.

这项工作改进了计量数据集的表面配准方法，以提高增材制造 (AM) 晶格的多方法鉴定精度。从 X 射线计算机断层扫描和 AM 晶格的坐标测量机获取的数据集，使用基于理论补充表面定义的导出几何基准特征进行对齐，该理论补充表面定义已在最近的标准草案中建立，但使用复杂的 AM 结构进行的检查有限。推导了基于空间相关子采样的晶格几何的精细采样配准方法，并证明该方法可以在统计上减少测量源之间的变化。明确定义的抽样实践和定义的重要性得到了强调。讨论了该方法对复杂增材制造零件的多方法鉴定的适用性。这项工作为利用新标准中正在考虑的规范以及可以采用的验证技术奠定了基础。