This guide briefly summarizes issues and considerations important for the use of x-ray photoelectron spectroscopy (XPS) for characterizing nanoparticles, which are important in many areas of science and technology. Because the surfaces play a major role in determining nanoparticle behaviors, XPS is an increasingly useful tool for understanding their properties, including addressing variations and nonreproducibility issues associated with these materials. The unusual physical and chemical behaviors of these particles must be considered in preparing and characterizing these materials. This guide is one of a series intended to highlight the best practices in the use of XPS.

中文翻译：

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在纳米颗粒上进行XPS测量的指南

本指南简要概述了使用X射线光电子能谱（XPS）表征纳米颗粒时重要的问题和注意事项，这在许多科学和技术领域都很重要。由于表面在决定纳米粒子的行为方面起着重要作用，因此XPS是一种越来越有用的工具，可用于了解其特性，包括解决与这些材料相关的变化和不可重复性问题。在制备和表征这些材料时，必须考虑这些颗粒的异常物理和化学行为。本指南是旨在重点介绍XPS使用最佳实践的系列指南之一。