This guide deals with methods to control surface charging during XPS analysis of insulating samples and approaches to extracting useful binding energy information. The guide summarizes the causes of surface charging, how to recognize when it occurs, approaches to minimize charge buildup, and methods used to adjust or correct XPS photoelectron binding energies when charge control systems are used. There are multiple ways to control surface charge buildup during XPS measurements, and examples of systems on advanced XPS instruments are described. There is no single, simple, and foolproof way to extract binding energies on insulating material, but advantages and limitations of several approaches are described. Because of the variety of approaches and limitations of each, it is critical for researchers to accurately describe the procedures that have been applied in research reports and publications.

中文翻译：

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XPS指南：绝缘样品的电荷中和和结合能参考

本指南介绍了在绝缘样品的XPS分析过程中控制表面电荷的方法，以及提取有用的结合能信息的方法。该指南概述了表面电荷产生的原因，如何识别何时发生，最小化电荷累积的方法以及使用电荷控制系统时用于调整或校正XPS光电子结合能的方法。在XPS测量过程中，有多种方法可以控制表面电荷的积累，并介绍了高级XPS仪器上的系统示例。在绝缘材料上提取结合能没有单一，简单和简单的方法，但是描述了几种方法的优点和局限性。由于每种方法的多样性和局限性，