当前位置: X-MOL 学术Photonics Res. › 论文详情
Our official English website, www.x-mol.net, welcomes your feedback! (Note: you will need to create a separate account there.)
Chip-scale Full-Stokes Spectropolarimeter in Silicon Photonic Circuits
Photonics Research ( IF 6.6 ) Pub Date : 2020-05-14 , DOI: 10.1364/prj.385008
Zhongjin Lin , Tigran Dadalyan , Simon Bélanger-de Villers , Tigran Galstian , Wei Shi

Wavelength-dependent polarization state of light carries crucial information about light-matter interactions. However, its measurement is limited to bulky, energy-consuming devices, which prohibits many modern, portable applications. Here, we propose and demonstrate a chip-scale spectropolarimeter implemented using a CMOS-compatible silicon photonics technology. Four compact Vernier microresonator spectrometers are monolithically integrated with a broadband polarimeter consisting of a 2D nanophotonic antenna and a polarimetric circuit to achieve full-Stokes spectropolarimetric analysis. The proposed device offers a solid-state spectropolarimetry solution with a small footprint of 1*0.6 mm2 and low power consumption of 360 mW}. Full-Stokes spectral detection across a broad spectral range of 50 nm with a resolution of 1~nm is demonstrated in characterizing a material possessing structural chirality. The proposed device may enable a broader application of spectropolarimetry in the fields ranging from biomedical diagnostics and chemical analysis to observational astronomy.

中文翻译:

硅光子电路中的芯片级全斯托克斯分光偏振计

光的波长相关偏振态携带有关光与物质相互作用的关键信息。然而,它的测量仅限于笨重、耗能的设备,这阻碍了许多现代便携式应用。在这里,我们提出并演示了使用 CMOS 兼容的硅光子技术实现的芯片级分光偏振计。四个紧凑型 Vernier 微谐振器光谱仪与宽带偏振计单片集成,该宽带偏振计由 2D 纳米光子天线和偏振电路组成,以实现全斯托克斯光谱偏振分析。所提出的设备提供了一种固态分光偏振测量解决方案,占地面积小,仅为 1*0.6 mm2,功耗低至 360 mW}。在表征具有结构手性的材料时,证明了在 50 nm 的宽光谱范围内进行全斯托克斯光谱检测,分辨率为 1~nm。所提出的设备可以使光谱偏振法在从生物医学诊断和化学分析到观测天文学的领域中得到更广泛的应用。
更新日期:2020-05-14
down
wechat
bug