The erosion behavior of liquid tin (Sn) under bias voltage system assisted Ar plasma environment in SCU-PSI was investigated. Optical emission spectroscopy was applied to detect and characterize the emission line of tin spectrum. The result showed that the loss part of tin atom in the plasma beam was very limited. The temperature-dependent abnormal enhanced erosion phenomenon was observed during the plasma irradiation process, and superficial adsorbed atoms model was employed to depict the inherent physical process. The obtained surface binding energy fitted well to our experiment results and other reports. In addition, the incident energy-dependent enhanced erosion behavior was also discussed, obvious tiny tin droplets could be observed separating from capillary porous system at the bias voltage of 25 V, which would be the incident plasma limit value for our experimental setup.

中文翻译：

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SCU-PSI中高通量等离子体环境下Sn-CPS的侵蚀研究

研究了 SCU-PSI 中液态锡 (Sn) 在偏压系统辅助 Ar 等离子体环境下的侵蚀行为。应用光发射光谱检测和表征锡光谱的发射谱线。结果表明，等离子体束中锡原子的损失部分非常有限。在等离子体辐照过程中观察到温度依赖的异常增强侵蚀现象，并采用表面吸附原子模型来描述固有的物理过程。获得的表面结合能与我们的实验结果和其他报告非常吻合。此外，还讨论了与入射能量相关的增强侵蚀行为，在 25 V 偏置电压下可以观察到明显的微小锡滴与毛细管多孔系统分离，