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Direct Observation of the Surface Topography at High Temperature with SEM
Microscopy and Microanalysis ( IF 2.9 ) Pub Date : 2020-04-03 , DOI: 10.1017/s1431927620001348
Renaud Podor 1 , Xavier Le Goff 1 , Joseph Lautru 1 , Henri-Pierre Brau 1 , Mathias Barreau 2 , Xavier Carrier 2 , Jerôme Mendonça 1, 3 , Dorian Nogues 3 , Antoine Candeias 3
Affiliation  

High-temperature scanning electron microscopy allows the direct study of the temperature behavior of materials. Using a newly developed heating stage, tilted images series were recorded at high temperature and 3D images of the sample surface were reconstructed. By combining 3D images recorded at different temperatures, the variations of material roughness can be accurately described and associated with local changes in the topography of the sample surface.

中文翻译:

用 SEM 直接观察高温下的表面形貌

高温扫描电子显微镜可以直接研究材料的温度行为。使用新开发的加热台,在高温下记录倾斜图像系列,并重建样品表面的 3D 图像。通过结合在不同温度下记录的 3D 图像,可以准确地描述材料粗糙度的变化,并将其与样品表面形貌的局部变化相关联。
更新日期:2020-04-03
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