This paper reports a diagnostic method for clarifying performance bottlenecks of superconducting wires and tapes for their further performance enhancements. In particular, our achievements by scanning Hall-probe microscopy (SHPM), which worked well for selecting positions for microstructure observation by SEM, TEM, and X-ray CT, are introduced. This hybrid microscopy offers the information of direct relationship between the performance of a practical-scale superconducting wire or tape and its origin in micro-scale or nano-scale structure. As such examples, characterization results for an MgB2 multi-filamentary wire, a commercially available long RE-123 coated conductor, and a striated multi-filamentary coated conductor are reported in this paper through reviewing our past studies.

中文翻译：

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扫描霍尔探针显微镜用于特定地点观察超导线材和带材的微观结构，以澄清其性能瓶颈

本文报告了一种诊断方法，用于澄清超导线材和带材的性能瓶颈，以进一步提高性能。特别介绍了我们通过扫描霍尔探针显微镜 (SHPM) 取得的成果，该显微镜在选择 SEM、TEM 和 X 射线 CT 的微观结构观察位置方面效果很好。这种混合显微镜提供了实用规模超导线或带的性能与其在微米级或纳米级结构中的起源之间的直接关系的信息。作为此类示例，本文通过回顾我们过去的研究报告了 MgB2 复丝线、市售的长 RE-123 涂层导体和条纹复丝涂层导体的表征结果。