As known, the detector response function in the detection of alpha particles is characterized by the following distributions: electronic excitation and ionization, electron–hole pair statistics, and electronic noise contribution. The distribution due to the ionization–excitation process is of particular relevance, because it is not Gaussian and contributes essentially to the asymmetry of the alpha lines. For this work, we adapted the well-known code SRIM, to obtain and analyze the ionization/excitation distributions for alpha-particles in silicon, in a wide range of energies from 0.5 to 10 MeV. These curves were later well-fitted to a function corresponding to the convolution of a Gaussian with exponentials truncated in the low-energy zone of the distribution. A detailed study about the dependence of all the fitting parameters on energy was performed. The parametrization carried out in this work can also be an useful tool to generate the corresponding ionization–excitation curves required in the task of reproducing real alpha-particle spectra.

众所周知，α粒子检测中的检测器响应功能具有以下分布：电子激发和电离，电子-空穴对统计和电子噪声贡献。由于电离-激发过程引起的分布特别重要，因为它不是高斯分布，并且实质上导致了α线的不对称。对于这项工作，我们改编了众所周知的代码SRIM，以获取和分析在0.5到10 MeV的宽范围能量中硅中的α粒子的电离/激发分布。这些曲线后来很好地拟合了一个函数，该函数对应于高斯卷积的函数，该指数在分布的低能区被截断。对所有拟合参数对能量的依赖性进行了详细研究。在这项工作中进行的参数化也可以成为生成真实α粒子光谱任务中所需的相应电离激发曲线的有用工具。