Abstract

Many visualizations of microchannel flows illuminate a significant portion, if not all, of the channel. This volume illumination degrades the axial spatial resolution of microscale particle velocimetry measurements because signal from out-of-focus tracer particles “contaminates” the image. We present here a novel way to improve the axial spatial resolution of such velocimetry measurements, structured illumination microscopy (SIM) particle-tracking velocimetry (PTV). In these initial proof of concept experiments, double-exposure SIM PTV was used to measure velocities in plane Poiseuille flow. The velocity results obtained from the SIM images have significantly less error and standard deviation than standard microscale PTV data obtained with volume illumination. Our estimates also suggest that the axial spatial resolution of the SIM results is a twofold improvement over those obtained with “standard” microscale PTV.

Graphic abstract

中文翻译：

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结构照明显微镜：提高微米级测速仪轴向空间分辨率的新方法

摘要

微通道流的许多可视化显示了很大一部分通道，即使不是全部。由于来自散焦示踪剂颗粒的信号“污染”了图像，因此这种体积照明会降低微尺度颗粒测速测量的轴向空间分辨率。我们在这里提出一种新颖的方法来改善这种测速技术测量的轴向空间分辨率，结构化照明显微镜（SIM）粒子跟踪测速技术（PTV）。在这些初步的概念验证实验中，使用双重曝光SIM PTV来测量平面Poiseuille流中的速度。从SIM图像获得的速度结果与通过体积照明获得的标准微尺度PTV数据相比，具有明显更少的误差和标准偏差。

图形摘要