Within the scope of the comprehensive elucidation of the entire process chain for the production of highly functional thin films made of semiconducting aluminum-doped zinc oxide () nanocrystals, this work deals with the detailed investigation of the stabilization sub-process, considering the requirements for the subsequent coating process. An innovative investigation procedure using non-invasive small angle X-ray scattering () is developed, enabling an evaluation of qualitative and quantitative dispersion stability criteria of sterically stabilized nanocrystals. On the one hand, qualitative criteria for minimizing layer inhomogeneities due to sedimentation as well as aggregate formation are discussed, enabling a high particle occupancy density. On the other hand, a procedure for determining the concentration using , both in the stable phase and in the non-stabilized phase, is demonstrated to provide a quantitative evaluation of the stabilization success, having a significant impact on the final layer thickness. The obtained insights offer a versatile tool for the precise stabilization process control based on synthesis process using to meet coating specific requirements and thus a successful integration into the entire process chain for the production of functional thin films.

中文翻译：

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使用小角度X射线散射评估AZO介晶在加工成功能薄膜时的分散稳定性

在全面阐明由半导体掺杂铝的氧化锌纳米晶体制成的高功能薄膜的生产的整个过程链的范围内，这项工作着眼于稳定化子过程的详细研究，并考虑了随后的涂覆过程。开发了一种创新的研究程序，使用无创小角X射线散射（），可以评估空间稳定的纳米晶体的定性和定量色散稳定性标准。一方面，讨论了用于最小化由于沉降以及聚集体形成而导致的层不均匀性的定性标准，从而实现了较高的颗粒占用密度。另一方面，使用，稳定阶段和非稳定阶段的数据均被证明可提供稳定成功的定量评估，对最终层的厚度有重大影响。所获得的见解为基于合成工艺的精确稳定化工艺控制提供了一种通用工具，该工艺用于满足涂料的特定要求，从而成功地集成到了整个生产链中，以生产功能性薄膜。