当前位置: X-MOL 学术Microscopy › 论文详情
Our official English website, www.x-mol.net, welcomes your feedback! (Note: you will need to create a separate account there.)
Recent progress in synchrotron radiation 3D–4D nano-imaging based on X-ray full-field microscopy
Microscopy ( IF 1.5 ) Pub Date : 2020-05-06 , DOI: 10.1093/jmicro/dfaa022
Akihisa Takeuchi 1 , Yoshio Suzuki 2
Affiliation  

The advent of high-flux, high-brilliance synchrotron radiation (SR) has prompted the development of high-resolution X-ray imaging techniques such as full-field microscopy, holography, coherent diffraction imaging, and ptychography. These techniques have strong potential to establish non-destructive three- and four-dimensional nanoimaging when combined with computed tomography (CT), called nano-tomography (nano-CT). X-ray nano-CTs based on full-field microscopy are now routinely available and widely used. Here we discuss the current status and some applications of nano-CT using a Fresnel zone plate as an objective. Optical properties of full-field microscopy, such as spatial resolution and off-axis aberration, which determine the effective field of view, are also discussed, especially in relation to 3D tomographic imaging.

中文翻译:

基于X射线全视场显微镜的同步辐射3D-4D纳米成像研究进展

高通量、高亮度同步辐射 (SR) 的出现促进了高分辨率 X 射线成像技术的发展,例如全视场显微镜、全息、相干衍射成像和 ptychography。当与计算机断层扫描 (CT) 相结合时,这些技术具有建立非破坏性三维和四维纳米成像的巨大潜力,称为纳米断层扫描 (nano-CT)。基于全视野显微镜的 X 射线纳米 CT 现在已经常规可用并被广泛使用。在这里,我们讨论了使用菲涅耳波带板作为物镜的纳米 CT 的现状和一些应用。还讨论了全场显微镜的光学特性,例如空间分辨率和轴外像差,它们决定了有效视场,尤其是与 3D 断层成像相关的内容。
更新日期:2020-05-06
down
wechat
bug