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Gaussian source beam diffraction by a perfect electromagnetic half-plane.
Journal of the Optical Society of America A ( IF 1.4 ) Pub Date : 2020-05-07 , DOI: 10.1364/josaa.389239
Husnu Deniz Basdemir

In the present work, diffraction of a Gaussian source beam by a perfect electromagnetic conductor (PEMC) semi-screen is investigated. Due to the special property of the PEMC sheet, which is a combination of perfect electric conductor and perfect magnetic conductor surfaces, the reflected wave from the PEMC surface has a cross-polarized component in addition to the co-polarized component. For an electric line source illumination, the diffracted fields are derived by considering the analogy between the transition boundaries and scattered geometric optics fields. Later, the complex point source technique is applied for evaluation of Gaussian beam diffraction. The finite magnitude values of fields are derived with the aid of an improved version of the well-known uniform theory of diffraction for evanescent plane waves. Also, the resultant waves are plotted and discussed for different groups of parameters.

中文翻译:

高斯源光束通过完美的电磁半平面衍射。

在目前的工作中,研究了完美电磁导体(PEMC)半屏对高斯源光束的衍射。由于PEMC片材的特殊性能,它是完美的电导体和完美的磁导体表面的结合,因此,来自PEMC表面的反射波除具有同极化分量外,还具有交叉极化分量。对于电线源照明,通过考虑过渡边界和散射几何光学场之间的类比来得出衍射场。后来,复点源技术被用于评估高斯光束衍射。借助于e逝平面波的众所周知的均匀衍射理论的改进版本,可以得出场的有限幅值。也,
更新日期:2020-05-07
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