Advanced Ni8W/Ni12W/Ni8W alloy composite substrates used in YBCO-coated conductors with a strong cube texture and high yield strength have been fabricated, and a CeO2 buffer layer film was successfully deposited on the composite substrates. Through in situ tensile testing coupled with electron backscattered diffraction (EBSD) analysis, the stability of the cube texture of Ni8W/Ni12W/Ni8W alloy composite substrates has been investigated. The stress–strain curve shows that the yield strength (at 0.2% strain) of the composite substrates exceeds 250 Mpa. The orientation of grains and boundaries on the surface of the substrates was almost unchanged, while the strain exceeds 0.2%, which indicated that the composite substrates are adequate for depositing buffer layers and YBCO layers by the reel-to-reel process.

中文翻译：

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用于 YBCO 涂层导体的高级复合基板中稳定立方体纹理的原位 EBSD 研究

制备了具有强立方体织构和高屈服强度的用于 YBCO 涂层导体的先进 Ni8W/Ni12W/Ni8W 合金复合基片，并制备了 CeO2缓冲层薄膜成功沉积在复合基板上。通过原位拉伸试验结合电子背散射衍射（EBSD）分析，研究了Ni8W/Ni12W/Ni8W合金复合基体立方体织构的稳定性。应力-应变曲线显示复合基材的屈服强度（在 0.2% 应变下）超过 250 Mpa。基板表面的晶粒和边界的取向几乎没有变化，而应变超过0.2%，这表明复合基板足以通过卷到卷工艺沉积缓冲层和YBCO层。