In situ synchrotron X-ray diffraction was used to investigate the electrochemical reduction of SiO₂ to Si in molten CaCl₂ at 1123 K for the first time. The present technique enabled direct determination of intermediate products at high temperature, without cooling and washing treatments. Based on the diffraction data, the Ca₂SiO₄ phase was detected inside the electrode, but not at the electrode edge. These results were explained by the presence of different concentrations of O²⁻ ions in molten CaCl₂ permeating different regions of the electrode.

中文翻译：

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原位同步加速器X射线衍射研究熔融CaCl ₂中SiO ₂的电化学还原

原位同步加速器X射线衍射首次用于研究在1123 K下熔融CaCl ₂中SiO ₂还原为Si 。本技术能够直接确定高温下的中间产物，而无需冷却和洗涤处理。基于衍射数据，在电极内部而非电极边缘检测到Ca ₂ SiO ₄相。这些结果可以通过渗透到电极不同区域的熔融CaCl _2中存在不同浓度的O ^2-离子来解释。