Spectral measurement of tungsten (W) impurity is essential to study impurity transport. Therefore, an X-ray crystal spectrometer (XCS) on EAST was used to measure the line spectra from highly ionized W ions. On EAST, both poloidal XCS and tangential XCS have been developed to measure the plasma temperature as well as the rotation velocity. Recently, He-like and H-like argon spectra have also been obtained using a two-crystal setup. W lines are identified in this study. Through a careful analysis, the W lines of 3.9336, 3.9321, and 3.664 Å are found to be diffracted by He-like or H-like crystals. The lines are confirmed with the NIST database. We also calculated the ion temperature with Doppler broadening of these lines. The ion temperature from the W lines is entirely consistent with that from Ar line spectra. The measurement of these W line spectra could be used to study W impurity transport in future work.

中文翻译：

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在EAST上使用双晶X射线晶体光谱仪测量钨杂质光谱

钨（W）杂质的光谱测量对于研究杂质传输至关重要。因此，EAST上的X射线晶体光谱仪（XCS）用于测量高度电离的W离子的线谱。在EAST上，已经开发了极向XCS和切向XCS来测量等离子体温度以及旋转速度。最近，还使用双晶装置获得了He类和H类氩光谱。在这项研究中确定了W线。通过仔细分析，发现3.9336、3.9321和3.664Å的W线被类He或类H晶体衍射。这些行已通过NIST数据库确认。我们还用这些线的多普勒展宽计算了离子温度。W线的离子温度与Ar线光谱的离子温度完全一致。