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Combining high temperature sample preparation and in-situ magnetic fields in XPEEM
Ultramicroscopy ( IF 2.1 ) Pub Date : 2020-07-01 , DOI: 10.1016/j.ultramic.2020.113010
Anna Mandziak 1 , Juan de la Figuera 2 , Jose Emilio Prieto 2 , Jordi Prat 3 , Michael Foerster 3 , Lucía Aballe 3
Affiliation  

We present a custom-made sample holder system for use in Elmitec Low Energy and PhotoEmission Electron Microscopes. It consists of two different sample holder bodies: one with a filament for high temperature measurements (up to more than 1500 K) and the other with integrated electromagnets for the in-situ application of in-plane/out-of-plane small magnetic fields. The sample is placed on a platelet which can be transferred between the two holders. This opens up new possibilities for the preparation of samples at high temperatures and investigation of their behavior under applied magnetic fields without leaving the ultra high vacuum system.

中文翻译:

在 XPEEM 中结合高温样品制备和原位磁场

我们展示了一种用于 Elmitec 低能量和光发射电子显微镜的定制样品架系统。它由两种不同的样品架主体组成:一种带有用于高温测量(高达 1500 K 以上)的灯丝,另一种带有用于原位应用平面内/平面外小磁场的集成电磁体. 样品被放置在可以在两个支架之间转移的血小板上。这为在高温下制备样品以及在不离开超高真空系统的情况下研究它们在外加磁场下的行为开辟了新的可能性。
更新日期:2020-07-01
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