Abstract

Aluminum zig-zag thin film was coated on the glass substrate by the oblique angle deposition (OAD) method. X-ray diffraction (XRD) revealed the formation of cubic phase with the peak in the (111) plane. The field emission scanning electron microscopy (FESEM) analysis used to estimate the films thickness, columns magnitude and its shape. The unpolarized light absorption spectrum of the zig-zag Al thin film was obtained by spectroscopy analysis in 330–850 nm. Besides, the scattering and absorption spectra of these nanostructures were simulated by the discrete dipole approximation (DDA) and the results compared to the empirical data. The Al zig-zag thin film was simulated by an array of electric dipoles and optical spectra were obtained as function of azimuthal angles and arm lengths. The simulation results show that, at the zero degree incident angles for different azimuthal angles the peaks intensity increases by decreasing azimuthal angle. Besides, by increasing the arm lengths, the peak of shorter wavelength shifts toward the longer wavelengths and the peak of longer wavelength become sharper. From a general viewpoint, the observations had a good agreement to empirical data, nevertheless, the differences needs special attention.

Graphical abstract

中文翻译：

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与离散偶极近似结果相比，Al /玻璃之字形薄膜的制备和表征

摘要

通过倾斜角沉积（OAD）方法将Z字形铝薄膜涂覆在玻璃基板上。X射线衍射（XRD）揭示了立方相的形成，其峰位于（111）平面。场发射扫描电子显微镜（FESEM）分析用于估计膜的厚度，柱的大小及其形状。之字形铝薄膜的非偏振光吸收光谱是通过在330-850 nm的光谱分析获得的。此外，通过离散偶极近似（DDA）模拟了这些纳米结构的散射和吸收光谱，并将结果与​​经验数据进行了比较。用电偶极子阵列模拟了Al字形薄膜，并获得了作为方位角和臂长的函数的光谱。仿真结果表明，在针对不同方位角的零度入射角处，峰值强度通过减小方位角而增加。此外，通过增加臂长，较短波长的峰向较长波长偏移，较长波长的峰变尖。从一般角度来看，这些观察结果与经验数据具有很好的一致性，但是，这些差异需要特别注意。

图形概要