Anti‐Counterfeiting Microstructures Induced by Ultrashort Laser Pulses,Physica Status Solidi (A) - Applications and Materials Science

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Anti‐Counterfeiting Microstructures Induced by Ultrashort Laser Pulses
Physica Status Solidi (A) - Applications and Materials Science Pub Date : 2020-04-21 , DOI: 10.1002/pssa.201901052
Jing Qian _{1,

2} , Quan-Zhong Zhao _{1,

2}

Affiliation

Anti‐counterfeiting microstructures are induced by ultrashort laser pulses in four kinds of materials. 1) Computer‐generated holograms of “SIOM” are written pixel‐by‐pixel using focused laser pulses by evaporation of aluminum films on silica substrates. Pixels are well‐defined holes, which can be reconstructed by He–Ne laser. 2) On stainless steel, surface ripples are induced with its orientation perpendicular to laser polarization. With “S‐O” and “I‐M” written with orthogonal laser polarizations, selective display of “SIOM” is achieved. Spatially overlapped “E” and “F” are also selectively displayed. 3) Luminous point defect of non‐bridging oxygen hole center (NBOHC) is generated in hydroxyl‐fused silica by ultrashort laser pulses. Due to photoluminescence (PL) of NBOHC, a barcode fabricated in hydroxyl‐fused silica is invisible in sunlight, while can be read out by 254 nm UV light. 4) Long persistent luminescence (LPL) is a phenomenon that PL continues for an obvious length of time when excitation source is removed. In homemade Mn²⁺‐doped germanate glass, LPL is observed from characters of “SIOM” written by laser pulses. “SIOM” then act as luminous centers. An exposure of 365 nm UV light enables the reappearance of LPL in “SIOM.” These phenomena can enable anti‐counterfeiting applications, and the mechanisms are also discussed.

中文翻译：

超短激光脉冲诱导的防伪微结构

防伪微结构是由四种材料中的超短激光脉冲引起的。1）计算机生成的“ SIOM”全息图是使用聚焦激光脉冲通过在二氧化硅基板上蒸发铝膜逐像素写入的。像素是定义明确的孔，可以使用He–Ne激光对其进行重建。2）在不锈钢上，会产生垂直于激光偏振方向的表面波纹。通过用正交激光偏振写入“ S-O”和“ I-M”，可以实现“ SIOM”的选择性显示。空间重叠的“ E”和“ F”也会有选择地显示。3）超短激光脉冲在羟基熔融二氧化硅中产生非桥接氧孔中心（NBOHC）的发光点缺陷。由于NBOHC的光致发光（PL），在阳光下看不见用羟基熔融二氧化硅制成的条形码，可以被254 nm紫外线读取。4）长时间持续发光（LPL）是在去除激励源后PL持续明显的时间长度的现象。自制锰从激光脉冲写入的“ SIOM”字符中可以观察到掺有^2+的德国锗玻璃的LPL。然后，“ SIOM”充当发光中心。365 nm紫外线的照射使LPL重新出现在“ SIOM”中。这些现象可以启用防伪应用程序，并对其机制进行了讨论。

更新日期：2020-04-21

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