We study extreme and critical events in the forced Liénard systems with charge control memristor. It has been found that the system exhibits hidden attractors either in the absence or presence of an external sinusoidal force. We give evidence that these attractors play a crucial role in the appearance of critical events. We attempt to explain the mechanism leading to the emergence of catastrophic transitions. Finally, we present that the observed critical transitions are typical for memristor based models and understanding of them gives some insight on how to avoid these types of devastating events at the time of the device fabrication process.

中文翻译：

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基于忆阻器的Liénard系统中的极端和关键过渡事件

我们研究带有电荷控制忆阻器的强制Liénard系统中的极端事件和临界事件。已经发现，该系统在不存在或存在正弦力的情况下都表现出隐藏的吸引子。我们提供的证据表明，这些吸引子在重大事件的出现中起着至关重要的作用。我们试图解释导致灾难性转变出现的机制。最后，我们提出，所观察到的临界转变对于基于忆阻器的模型是典型的，对它们的理解为如何在器件制造过程中避免此类破坏性事件提供了一些见识。