Measurement of surface plasmon and surface wave propagation is important for the operation and characterization of sensors and microscope systems. One challenge is to perform these measurements both quickly and with good spatial resolution without any modification to the sample surface. This paper addresses these issues by projecting an image of the field excited from a defocused sample to a magnified image plane. By carefully analysing the intensity distribution in this plane the properties of the surface waves generated on the sample surface can be determined. This has the advantage over previous techniques that the data can be obtained in a single shot without any changes to the focal position of the sample. Equally importantly, we show the method measures the local properties of the sample at well-defined positions, whereas other methods such as direct observation of the back focal plane average the properties over the propagation length of the surface waves.

中文翻译：

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离焦泄漏辐射显微镜用于单次表面等离激元测量

表面等离激元和表面波传播的测量对于传感器和显微镜系统的操作和表征很重要。一个挑战是在不对样品表面进行任何修改的情况下，以良好的空间分辨率快速执行这些测量。本文通过将散焦样本激发的场的图像投影到放大的图像平面上来解决这些问题。通过仔细分析该平面上的强度分布，可以确定在样品表面上产生的表面波的特性。与以前的技术相比，它具有以下优势：可以在一次拍摄中获得数据，而无需改变样品的焦点位置。同样重要的是，我们展示了该方法可在定义明确的位置测量样品的局部特性，