Cathodoluminescence (CL) has evolved into a standard analytical technique in (scanning) transmission electron microscopy. CL utilizes light excited due to the interactions between the electron-beam and the sample. In the present study we focus on Cˇerenkov radiation. We make use of the fact that the electron transparent specimen acts as a Fabry-Pérot interferometer for coherently emitted radiation. From the wavelength dependent interference pattern of thickness dependent measurements we calculate the refractive index of the studied material. We describe the limits of this approach and compare it with the determination of the refractive index by using valence electron energy loss spectrometry (VEELS).

中文翻译：

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使用 Cˇerenkov 辐射通过干涉法阴极发光测量厚样品的折射率

阴极发光 (CL) 已发展成为（扫描）透射电子显微镜中的标准分析技术。CL 利用由于电子束和样品之间的相互作用而激发的光。在本研究中，我们关注 Cˇerenkov 辐射。我们利用电子透明样品作为相干发射辐射的法布里-珀罗干涉仪这一事实。根据厚度相关测量的波长相关干涉图，我们计算所研究材料的折射率。我们描述了这种方法的局限性，并将其与使用价电子能量损失光谱法 (VEELS) 确定的折射率进行了比较。