This paper presents a new analytical method to determine interface normals from a series of bright/dark field images taken from arbitrary orientations. This approach, based on a general geometrical model of interface projection, provides a generalized formulation of existing methods. It can treat an excessive number of inputs, i.e. orientation conditions. Given 6 or more sets of inputs, even with considerable experimental errors, we prove that this method is still very likely to yield results with satisfactory accuracy. The robustness of the method can thus allow its implementation in problems dealing with a large amount of data. We show that this method can also be applied to determine 1D features or to check the planarity of microstructural features.

中文翻译：

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TEM 界面法线确定的通用且稳健的分析方法

本文提出了一种新的分析方法，可以从一系列从任意方向拍摄的明/暗场图像中确定界面法线。这种方法基于界面投影的通用几何模型，提供了现有方法的通用公式。它可以处理过多的输入，即方向条件。给定 6 组或更多组输入，即使有相当大的实验误差，我们证明这种方法仍然很有可能产生令人满意的精度结果。因此，该方法的稳健性可以使其在处理大量数据的问题中得以实施。我们表明这种方法也可以用于确定一维特征或检查微结构特征的平面度。