Abstract Recent developments in Resonant Inelastic X-Ray Scattering Experiments have vastly improved the resolution in X-ray Spectroscopies such as X-ray Absorption. However, the use of Tender X-rays (∼3 keV) and the reactivity of actinides such as uranium have given rise to new questions about bulk and surface sensitivity, what constitutes a surface and how to characterize the formation of an oxide. It will be shown that the in situ electron scattering features that are part of the RIXS spectrum can be used to quantify the uranium oxide formation and determine cleanliness, independently of the near edge features that provide information about the unoccupied electronic density of states.

中文翻译：

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EXAFS 作为嫩 X 射线区域中锕系氧化物形成的探针

摘要 共振非弹性 X 射线散射实验的最新进展极大地提高了 X 射线光谱（如 X 射线吸收）的分辨率。然而，Tender X 射线（~3 keV）的使用和锕系元素（如铀）的反应性引发了关于体积和表面敏感性、表面的构成以及如何表征氧化物形成的新问题。将表明，作为 RIXS 光谱一部分的原位电子散射特征可用于量化氧化铀的形成并确定清洁度，而与提供有关未占据电子态密度的信息的近边缘特征无关。