The span‐restorable meta‐mesh model was previously designed as a cutting‐edge technique that enhanced the spare capacity efficiency in low average nodal degree networks. In this technique, lightpaths that fully traverse chains of degree‐2 nodes are provided with a logical express bypass span allowing a distinction between the internal and external working flow capacity that transit the chain. In the event of span failure, lightpaths which would normally traverse the chain in its entirety are allowed to fail back to its anchor nodes such that only the intrachain flow requires allocation of spare capacity. Previous work on the meta‐mesh design considered only single failure restorability. The work herein analyzes dual span failure situations by developing two new integer linear programming models. The first model provides the minimum total cost of designing a meta‐mesh network capable of withstanding dual span failure scenarios. The second model offers a maximization of the dual failure restorability by minimizing the number of nonrestored working capacities with a given limit of total spare capacity investment. Experiments are performed on six master test‐case networks of various topologies and scales.

中文翻译：

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跨度可恢复的元网格网络的双故障可恢复性分析

可跨度恢复的元网格该模型以前被设计为一种尖端技术，可提高低平均节点度网络中的备用容量效率。在此技术中，完全遍历2度节点链的光路具有逻辑上明确的旁路跨度，从而可以区分通过链的内部和外部工作流容量。在跨度失败的情况下，通常会完整地遍历整个链条的光路被允许失败返回其锚点节点，从而仅链内流需要分配备用容量。以前有关元网格设计的工作仅考虑了单个故障的可恢复性。本文的工作通过开发两个新的整数线性规划模型来分析双跨失效情况。第一个模型提供了设计能够承受双跨故障场景的元网格网络的最低​​总成本。第二种模型通过在给定的总备用容量投资限制的情况下，最大限度地减少了未还原的工作容量，从而最大限度地提高了双重故障的可修复性。实验是在六个具有不同拓扑和规模的主测试用例网络上进行的。