Mass resolution is a very important parameter for mass spectrometry. It is necessary to compare the mass resolution between the newly developed TOF‐SIMS and the conventionally high‐performance magnetic SIMS. However, the definitions of mass resolution for these two types of instruments are quite different. Whether it is possible to compare mass resolution and how to do such comparison is a challenge. This problem was raised officially during the 2012 ISO/TC 201 meeting at Tampa, Florida, the United States and the long‐term cooperation with ISO started afterwards. The definition of mass resolution is one of the most important and fundamental problems for mass spectrometry and should attract significant attention. Here, some detail discussions on mass resolution as well as the related experimental studies in the past few years, including the collaborations with ISO/TC 201/SC6 and SC1 are summarized. This summary covers the common problem for almost all the current existing and still used definitions of mass resolution. A reasonable new definition for mass resolution considering the peak shape or resolution function has been proposed, which has also been confirmed by using experimental studies of the mass resolution comparison between TOF and magnetic SIMS. This study lays a foundation for the future mass resolution comparisons between different mass spectrometry.

中文翻译：

---

关于二次离子质谱中质量分辨率的讨论

质量分辨率是质谱的一个非常重要的参数。有必要将新开发的TOF-SIMS与常规高性能磁性SIMS的质量分辨率进行比较。但是，这两类仪器的质量分辨率定义完全不同。能否比较质量分辨率以及如何进行比较是一个挑战。2012年在美国佛罗里达州坦帕市举行的ISO / TC 201会议上正式提出了这个问题，此后便开始了与ISO的长期合作。质谱的定义是质谱学最重要和最基本的问题之一，应引起广泛关注。在这里，对质量分辨率以及过去几年的相关实验研究进行了一些详细的讨论，总结了与ISO / TC 201 / SC6和SC1的合作。该概述涵盖了几乎所有现有的和仍在使用的质量分辨率定义的共同问题。已经提出了考虑峰形或分离度函数的质量分离度的合理新定义，这也已经通过使用TOF和磁性SIMS的质量分离度比较的实验研究得到了证实。这项研究为将来不同质谱之间的质量分辨率比较奠定了基础。使用TOF和磁SIMS的质量分辨率比较的实验研究也证实了这一点。这项研究为将来不同质谱之间的质量分辨率比较奠定了基础。使用TOF和磁性SIMS的质量分辨率比较的实验研究也证实了这一点。这项研究为将来不同质谱之间的质量分辨率比较奠定了基础。