Abstract

The influence of the skin effect and active loss in a semiconductor composite with a wide range of the values of the conductivity on the intensity of EPR absorption lines has been studied. An approach that enables one to obtain adequate agreement of the calculated and experimental results has been proposed. The absorption line intensity corresponding to the unit volume is shown can decrease by several times as the sample volume increases in the dependence on the conductivity of a material under study.

中文翻译：

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集肤效应和有源损耗对半导体材料中EPR线强度的影响

摘要

研究了在导电率值范围较宽的半导体复合材料中趋肤效应和有源损耗对EPR吸收谱线强度的影响。提出了一种方法，可以使计算结果和实验结果充分吻合。所显示的与单位体积相对应的吸收线强度可能会随着样品体积的增加而降低数倍，而样品体积取决于所研究材料的电导率。