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Secondary and Backscattered Electron Current Induced Differential Charging on a Triple Junction of Spacecraft
IEEE Transactions on Plasma Science ( IF 1.3 ) Pub Date : 2020-04-01 , DOI: 10.1109/tps.2020.2978907
Ashish B. Pandya , Nikhil Kothari , Rizwan H. Alad , Rashmi S. Joshi , Suryakant B. Gupta , Prarthan D. Mehta

This article discusses and analyzes the quantification of differential potential developed due to the effect of secondary electron yield (SEY) and backscattered electron yield (BEY) at adjacent dissimilar material surfaces present in a spacecraft. Subsequently, the differential potential creates electrostatic discharge (ESD). The threshold potential for generating the ESD is captured for the generalized case of differential charging on metallic patches embedded over a thin layer of the dielectric surface with the help of Spacecraft Plasma Interaction Experiments-II (SPIX-II) facilities. In view of the limitations of the experimental setup, numerical modeling is implemented to compute the differential charging for the recommended cases of plasma environment. The threat of an ESD event is indicated when the computed differential charging exceeds the ESD inception threshold voltage obtained from the experiments. Evaluation of the capacitance between material surfaces, which governs the timescale of differential charging, is carried out using the method of moments (MoM). The impact of diverse SEY and BEY of different materials on steady-state body potential is investigated. The validity of the analysis is also established with the results available in the open literature.

中文翻译:

航天器三联结二次和背向散射电子电流引起的差动充电

本文讨论并分析了由于航天器中相邻不同材料表面的二次电子产率 (SEY) 和背散射电子产率 (BEY) 的影响而产生的差分电势的量化。随后,差分电位会产生静电放电 (ESD)。在航天器等离子体相互作用实验-II (SPIX-II) 设施的帮助下,针对嵌入在介电表面薄层上的金属贴片上的差分充电的一般情况,捕获了产生 ESD 的阈值电位。鉴于实验设置的局限性,我们实施了数值建模来计算等离子体环境推荐情况下的差分充电。当计算的差分充电超过从实验获得的 ESD 起始阈值电压时,表明 ESD 事件的威胁。使用矩量法 (MoM) 对控制差分充电时间尺度的材料表面之间的电容进行评估。研究了不同材料的不同 SEY 和 BEY 对稳态体电位的影响。分析的有效性也建立在公开文献中可用的结果中。
更新日期:2020-04-01
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