The C²TN XMS-PIXE system based on a first generation X-ray Microcalorimeter Spectrometer (XMS) having 1.5% relative energy resolution at Si K$\alpha$ 1.739 keV and 0.5% relative energy resolution at Fe K$\alpha$ 6.403 keV, became operational in 2008, presaging various developments to emerge from its use and from connected or related but independent advancements by other laboratories. More than ten years having passed since the C²TN XMS-PIXE system first results, knowledge about XMSs use for PIXE has grown meaningfully and new applications are now envisaged and in progress. In the present work, results on the analysis of different copper compounds are presented, and used as an assessment of the capacity of High Resolution Energy Dispersive PIXE (HiRED-PIXE) to provide answers to the problem of copper pigments speciation in Cultural Heritage studies. Related issues of XMS spectra generation and calibration are discussed, as well as first generation systems limitations and its overcome by the use of second and third generation systems.

基于第一代X射线微热量计光谱仪（XMS）的C ² TN XMS-PIXE系统，在Si K处具有1.5％的相对能量分辨率$\alpha$ Fe K时为1.739 keV，相对能量分辨率为0.5％$\alpha$6.403 keV于2008年投入运行，预示了各种使用方法的发展以及其他实验室的相互关联或相关但独立的发展。自C ²以来已经十多年了TN XMS-PIXE系统取得的第一个成果是，有关XMS用于PIXE的知识已经有了有意义的增长，并且新的应用程序正在设想中并且正在开发中。在当前的工作中，提出了对不同铜化合物的分析结果，并将其用作对高分辨率能量分散PIXE（HiRED-PIXE）的能力的评估，从而为文化遗产研究中的铜颜料物种形成问题提供了答案。讨论了XMS光谱生成和校准的相关问题，以及第一代系统的局限性及其通过使用第二代和第三代系统所克服的问题。