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An implementation of hot-swap circuit with high reliability
Microelectronics Journal ( IF 1.9 ) Pub Date : 2020-04-13 , DOI: 10.1016/j.mejo.2020.104777
Dagang Li , Zehong Li , Wei Li , Hua Fan , Ce Wang , Hongrui Che , Xuanhong Zeng , Quanyuan Feng , Hadi Heidari

For the information transmission and application field of the bus, it is necessary to design a bus transceiver with high reliability and hot-swap ability. In order to achieve this requirement, this paper proposes a novel transceiver circuit with hot-swap structure. This structure effectively improves the transistor utilization efficiency and reduces the chip area on the premise of achieving the hot-swap performance. Furthermore, the traditional Schottky diode is avoided, and the hot-swap circuit proposed in this work can be implemented in any CMOS process. A prototype was fabricated in 0.5 μm CMOS technology, and the measurement results match well with the simulation results show that the chip meets the design requirements.



中文翻译:

具有高可靠性的热插拔电路的实现

对于总线的信息传输和应用领域,有必要设计一种具有高可靠性和热插拔能力的总线收发器。为了达到这一要求,本文提出了一种新型的具有热插拔结构的收发器电路。这种结构在达到热插拔性能的前提下有效地提高了晶体管的利用效率并减小了芯片面积。此外,避免了传统的肖特基二极管,并且这项工作中提出的热插拔电路可以在任何CMOS工艺中实现。原型制作在0.5微米CMOS技术,并且测量结果与模拟结果表明,该芯片符合设计要求匹配良好。

更新日期:2020-04-13
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