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Scintillation properties of Pr-doped Lu2Si2O7 single crystal
Radiation Measurements ( IF 2 ) Pub Date : 2020-06-01 , DOI: 10.1016/j.radmeas.2020.106320
Prom Kantuptim , Masaki Akatsuka , Daisuke Nakauchi , Takumi Kato , Noriaki Kawaguchi , Takayuki Yanagida

Abstract Pr doped Lutetium pyrosilicate Lu2Si2O7 (LPS) single crystals were synthesized by the floating zone method with different Pr concentration from 0.1% to 2.0%. After the confirmation of the phase by powder XRD patterns, optical and scintillation properties were investigated. When we observed photoluminescence (PL) emission spectra, emission due to 5d-4f transition of Pr3+ appeared in all the samples at wavelength of 300–340 nm, and PL decay times were similar around 9–11 ns in all the samples. In scintillation properties, under the X-ray excitation, all the samples had the same scintillation emission spectral shape with different emission intensities, and scintillation decay times were around 18–21 ns. Under 137Cs γ-rays irradiation, the 1.0% Pr doped sample showed the highest scintillation light yield among the present samples, and the value was 9700 ph/MeV. Furthermore, linearity as a function of γ-ray energy was observed.

中文翻译:

Pr掺杂Lu2Si2O7单晶的闪烁特性

摘要 采用浮区法合成了0.1%~2.0%不同Pr浓度的Pr掺杂焦硅镥Lu2Si2O7(LPS)单晶。在通过粉末 XRD 图案确认相之后,研究了光学和闪烁特性。当我们观察光致发光 (PL) 发射光谱时,由于 Pr3+ 的 5d-4f 跃迁在 300-340 nm 波长处出现在所有样品中,并且所有样品的 PL 衰减时间在 9-11 ns 左右相似。在闪烁特性方面,在X射线激发下,所有样品具有相同的闪烁发射光谱形状,但发射强度不同,闪烁衰减时间约为18-21 ns。在 137Cs γ 射线照射下,1.0% Pr 掺杂的样品在现有样品中显示出最高的闪烁光产额,值为 9700 ph/MeV。此外,观察到作为 γ 射线能量的函数的线性。
更新日期:2020-06-01
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