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Testing of a `hard' X-ray interferometer for experimental investigations.
Acta Crystallographica Section A: Foundations and Advances ( IF 1.8 ) Pub Date : 2020-04-16 , DOI: 10.1107/s2053273320002314
Tigran H Eyramjyan 1 , Mesrop H Mesropyan 2 , Tamara S Mnatsakanyan 1 , Minas K Balyan 1
Affiliation  

A `hard' X-ray LLL interferometer is tested for experimental investigations. The interferometer has both a base and a `ceiling', which are rigidly connected through columns. As a result, the interferometer does not have uncontrollable preliminary moiré. The intensity distribution is uniform in the interfering beams. It is shown that the interferometer is very sensitive to minor mechanical stresses. As a result, the interferometer must be freely placed on the goniometer head. Constant-thickness fringes are obtained using a wedge with a vertically placed apex. The volumes available for specimen placement are limited due to the existence of the ceiling. These difficulties can be overcome. The hard interferometer can be used for object and deformation investigations.

中文翻译:

测试“硬” X射线干涉仪以进行实验研究。

测试了“硬” X射线LLL干涉仪以进行实验研究。干涉仪既有底座又有“天花板”,它们通过柱子刚性连接。结果,干涉仪没有不可控的初始波纹。强度分布在干涉光束中是均匀的。结果表明,干涉仪对较小的机械应力非常敏感。因此,必须将干涉仪自由放置在测角仪头上。使用具有垂直放置的顶点的楔形获得恒定厚度的条纹。由于天花板的存在,可用于放置样品的体积受到限制。这些困难可以克服。硬干涉仪可用于物体和变形研究。
更新日期:2020-04-16
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