Comparison of azimuthal plots for reflection high-energy positron diffraction (RHEPD) and reflection high-energy electron diffraction (RHEED) for Si(111) surface.,Acta Crystallographica Section A: Foundations and Advances

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Comparison of azimuthal plots for reflection high-energy positron diffraction (RHEPD) and reflection high-energy electron diffraction (RHEED) for Si(111) surface.
Acta Crystallographica Section A: Foundations and Advances ( IF 1.9 ) Pub Date : 2020-03-26 , DOI: 10.1107/s2053273320001205
Zbigniew Mitura ₁

Affiliation

Azimuthal plots for RHEPD (reflection high-energy positron diffraction) and RHEED (reflection high-energy electron diffraction) were calculated using dynamical diffraction theory and then compared. It was assumed that RHEPD and RHEED azimuthal plots can be collected practically by recording the intensity while rotating the sample around the axis perpendicular to the surface (for the case of X-ray diffraction, such forms of data are called Renninger scans). It was found that RHEPD plots were similar to RHEED plots if they were compared at Bragg reflections of the same order. RHEPD plots can also be determined in the region of total external reflection and for such conditions multiple scattering effects turned out to be very weak. The findings for azimuthal plots are also discussed in the context of the formation mechanisms of Kikuchi patterns.

中文翻译：

Si(111) 表面反射高能正电子衍射 (RHEPD) 和反射高能电子衍射 (RHEED) 方位角图的比较。

利用动态衍射理论计算了 RHEPD（反射高能正电子衍射）和 RHEED（反射高能电子衍射）的方位角图，然后进行比较。假设 RHEPD 和 RHEED 方位图实际上可以通过记录强度来收集，同时绕垂直于表面的轴旋转样品（对于 X 射线衍射的情况，这种形式的数据称为 Renninger 扫描）。结果发现，如果在相同阶次的布拉格反射下进行比较，RHEPD 图与 RHEED 图相似。 RHEPD 图也可以在全外反射区域中确定，对于这种情况，多重散射效应非常弱。方位角图的发现也在菊池图案形成机制的背景下进行了讨论。

更新日期：2020-03-26

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