当前位置: X-MOL 学术Rapid Commun. Mass Spectrom. › 论文详情
Our official English website, www.x-mol.net, welcomes your feedback! (Note: you will need to create a separate account there.)
UV post-ionization laser ablation ionization mass spectrometry for improved nm-depth profiling resolution on Cr/Ni reference standard.
Rapid Communications in Mass Spectrometry ( IF 1.8 ) Pub Date : 2020-05-12 , DOI: 10.1002/rcm.8803
Valentine Grimaudo 1 , Marek Tulej 1 , Andreas Riedo 1 , Rustam Lukmanov 1 , Niels F W Ligterink 2 , Coenraad de Koning 1 , Peter Wurz 1
Affiliation  

Laser ablation combined with mass spectrometry forms a promising tool for chemical depth profiling of solids. At irradiations near the ablation threshold, high depth resolutions are achieved. However, at these conditions, a large fraction of ablated species is neutral and therefore invisible to the instrument. To compensate for this effect, an additional ionization step can be introduced.

中文翻译:

紫外后电离激光烧蚀电离质谱法可提高Cr / Ni参考标准品的纳米深度轮廓分辨率。

激光烧蚀与质谱结合形成了一种用于固体化学深度分析的有前途的工具。在接近消融阈值的照射下,可获得高深度分辨率。但是,在这些条件下,大部分烧蚀的物质是中性的,因此对于仪器是不可见的。为了补偿这种影响,可以引入额外的电离步骤。
更新日期:2020-05-12
down
wechat
bug