Wear and pit formation of a thermal-flying height-control (TFC) slider was studied as a function of bias voltage and environmental relative humidity (RH; 5%–85%). Burnishing tests were performed by applying an “over-push” heater power to the heater element, causing slider–disk contacts. The experimental results showed that both bias voltage and RH have a large effect on the power-to-contact change and the wear of the slider. Atomic force microscopy (AFM) was used to study the wear and pit formation as a function of bias voltage and RH. The wear of the slider surface was found to be less at the positive disk bias voltage compared with the negative disk bias voltage at all RH conditions. Pit formation was observed on the slider in the vicinity of the read–write transducer area when a positive bias voltage was applied to the disk at high RH conditions (85%). Pit formation was not observed at low RH.

中文翻译：

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偏压和相对湿度对磁头-磁盘界面磨损和凹坑形成的研究

研究了热飞行高度控制 (TFC) 滑块的磨损和凹坑形成与偏置电压和环境相对湿度 (RH; 5%–85%) 的函数关系。抛光测试是通过向加热元件施加“过度推动”加热器功率，导致滑块-盘接触来进行的。实验结果表明，偏置电压和相对湿度对触头的功率变化和滑块的磨损都有很大的影响。原子力显微镜 (AFM) 用于研究作为偏置电压和 RH 函数的磨损和凹坑形成。发现在所有 RH 条件下，与负磁盘偏置电压相比，在正磁盘偏置电压下滑块表面的磨损更小。当在高 RH 条件 (85%) 下向磁盘施加正偏压时，在读写传感器区域附近的滑块上观察到凹坑形成。在低 RH 下未观察到凹坑形成。