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Sub-λ/2 Displacement Sensor with Nanometric Precision based on Optical Feedback Interferometry used as a Non-Uniform Event-Based Sampling System
IEEE Sensors Journal ( IF 4.3 ) Pub Date : 2020-05-15 , DOI: 10.1109/jsen.2020.2970599
Olivier D. Bernal , Usman Zabit , Francis Jayat , Thierry Bosch

In this paper, a method based on the inherent event-based sampling capability of the laser optical feedback interferometry (OFI) is proposed to recover sub- $\lambda $ /2 displacement with a nanometric precision. The proposed method operates in open-loop configuration and relies on OFI’s fringe detection, thereby improving its robustness and ease of use. The measured white noise power spectral density is less than 100pm/ $\sqrt {\text {Hz}}$ with a corner noise frequency of approximately 80Hz for a laser diode emitting wavelength $\lambda _{{0}}$ of 785nm placed at 30cm of the target.

中文翻译:

基于光反馈干涉测量的具有纳米精度的亚λ/2位移传感器用作非均匀基于事件的采样系统

在本文中,提出了一种基于激光光反馈干涉测量(OFI)固有的基于事件的采样能力的方法来恢复亚 $\lambda $ /2 具有纳米精度的位移。所提出的方法在开环配置下运行,并依赖于 OFI 的条纹检测,从而提高了其鲁棒性和易用性。测得的白噪声功率谱密度小于100pm/ $\sqrt {\text {Hz}}$ 对于激光二极管发射波长,角噪声频率约为 80Hz $\lambda _{{0}}$ 785nm 放置在目标 30cm 处。
更新日期:2020-05-15
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