Improvements in the mass resolution of a mass spectrometer directly correlate to improvements in peak identification and quantification. Here, we describe a post-processing technique developed to increase the quality of mass spectra of strongly insulating samples in laser-pulsed atom probe microscopy. The technique leverages the self-similarity of atom probe mass spectra collected at different times during an experimental run to correct for electrostatic artifacts that present as systematic energy deficits. We demonstrate the method on fused silica (SiO2) and neodymium-doped ceria (CeO2) samples which highlight the improvements that can be made to the mass spectrum of strongly insulating samples.

中文翻译：

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一种用于校正绝缘样品原子探针质谱中系统能量缺陷的算法

质谱仪质量分辨率的改进与峰识别和定量的改进直接相关。在这里，我们描述了一种后处理技术，用于提高激光脉冲原子探针显微镜中强绝缘样品的质谱质量。该技术利用在实验运行期间不同时间收集的原子探针质谱的自相似性来校正表现为系统能量缺陷的静电伪影。我们展示了熔融石英 (SiO2) 和掺钕氧化铈 (CeO2) 样品的方法，这些样品突出了可以对强绝缘样品的质谱进行的改进。