Since its inception, the semiconductor industry has used a physical dimension (the minimum gate length of a transistor) as a means to gauge continuous technology advancement. This metric is all but obsolete today. As a replacement, we propose a density metric, which aims to capture how advances in semiconductor device technologies enable system-level benefits. The proposed metric can be used to gauge advances in future generations of semi-conductor technologies in a holistic way, by accounting for the progress in logic, memory, and packaging/integration technologies simultaneously.

中文翻译：

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半导体技术的密度度量

自成立以来，半导体行业一直使用物理尺寸（晶体管的最小栅极长度）作为衡量技术持续进步的手段。这个指标今天几乎过时了。作为替代，我们提出了一个密度指标，旨在捕捉半导体设备技术的进步如何实现系统级优势。通过同时考虑逻辑、存储器和封装/集成技术的进步，建议的指标可用于以整体方式衡量未来几代半导体技术的进步。