This paper discusses the reconstruction of partially sampled spectrum-images to accelerate the acquisition in scanning transmission electron microscopy (STEM). The problem of image reconstruction has been widely considered in the literature for many imaging modalities, but only a few attempts handled 3D data such as spectral images acquired by STEM electron energy loss spectroscopy (EELS). Besides, among the methods proposed in the microscopy literature, some are fast but inaccurate while others provide accurate reconstruction but at the price of a high computation burden. Thus none of the proposed reconstruction methods fulfills our expectations in terms of accuracy and computation complexity. In this paper, we propose a fast and accurate reconstruction method suited for atomic-scale EELS. This method is compared to popular solutions such as beta process factor analysis (BPFA) which is used for the first time on STEM-EELS images. Experiments based on real as synthetic data will be conducted.

中文翻译：

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从稀疏采样快速重建原子级 STEM-EELS 图像

本文讨论了重建部分采样光谱图像以加速扫描透射电子显微镜 (STEM) 中的采集。图像重建问题已在许多成像模式的文献中得到广泛考虑，但只有少数尝试处理 3D 数据，例如通过 STEM 电子能量损失光谱 (EELS) 获取的光谱图像。此外，在显微镜文献中提出的方法中，有些方法速度快但不准确，而另一些方法提供准确的重建，但代价是计算负担高。因此，在准确性和计算复杂性方面，所提出的重建方法都不能满足我们的期望。在本文中，我们提出了一种适用于原子级 EELS 的快速准确的重建方法。将此方法与首次用于 STEM-EELS 图像的 Beta 过程因子分析 (BPFA) 等流行解决方案进行了比较。将进行基于真实作为合成数据的实验。