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Enhanced Switching Properties in TaOx Memristors Using Diffusion Limiting Layer for Synaptic Learning
IEEE Journal of the Electron Devices Society ( IF 2.0 ) Pub Date : 2020-01-01 , DOI: 10.1109/jeds.2020.2966799
Pei-Yu Jung , Debashis Panda , Sridhar Chandrasekaran , Sailesh Rajasekaran , Tseung-Yuen Tseng

To move towards a new generation powerful computing system, brain-inspired neuromorphic computing is expected to transform the architecture of the conventional computer, where memristors are considered to be potential solutions for synapses part. We propose and demonstrate a novel approach to achieve remarkable improvement of analog switching linearity in TaN/Ta/TaOx/Al2O3/Pt/Si memristors by varying Al2O3 layer thickness. Presence of the Al2O3 layer is confirmed from the Auger Electron Spectroscopy study. Good analog switching ratio of about $100\times $ and superior switching uniformity are observed for the 1 nm Al2O3 based device. Multilevel capability of the memristive devices is also explored for prospective use as a synapse. More than 104 and $4\times 10^{4}$ cycles nondegradable dc and ac endurances, respectively, alongwith 104 second retention are achieved for the optimized device. Improved linearities of 2.41 and −2.77 for potentiation and depression, respectively are obtained for such 1 nm Al2O3-based devices. The property of gradual resistance changed by pulse amplitudes confirms that the TaOx memristors can be potentially used as an electronic synapse.

中文翻译:

使用扩散限制层进行突触学习,增强 TaOx 忆阻器的开关特性

为了迈向新一代强大的计算系统,受脑启发的神经形态计算有望改变传统计算机的架构,其中忆阻器被认为是突触部分的潜在解决方案。我们提出并展示了一种通过改变 Al 2 O 3层厚度显着改善 TaN/Ta/TaO x /Al 2 O 3 /Pt/Si 忆阻器中模拟开关线性度的新方法。俄歇电子能谱研究证实了 Al 2 O 3层的存在。良好的模拟开关比约为 $100\次 $ 对于基于 1 nm Al 2 O 3的器件,观察到了优异的开关均匀性。还探索了忆阻装置的多级能力,以作为突触的预期用途。超过 10 4 $4\乘以 10^{4}$ 循环不可降解的直流和交流耐力,以及 10 4秒的保持时间分别为优化的设备实现。对于这种基于1 nm Al 2 O 3的器件,增强和抑制的线性度分别提高了 2.41 和 -2.77 。由脉冲幅度改变的逐渐电阻的特性证实了 TaO x忆阻器可以潜在地用作电子突触。
更新日期:2020-01-01
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