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Study on conducted EMI noise source modelling applied in electromagnetic compatibility analysis based on GA in cooperation with LM
IET Power Electronics ( IF 1.7 ) Pub Date : 2020-04-02 , DOI: 10.1049/iet-pel.2019.0696
Zhou Mengxia 1 , Zhao Yang 1 , Yan Jingrui 2 , Yan Wei 1, 3 , Sun Minghui 1 , Wu Xianqiang 1 , Xiao Baoming 4
Affiliation  

In this study, a new method employing scattering parameters (SPs) method, genetic algorithm (GA) and Levenberg–Marquardt algorithm (LM) is proposed for modelling conducted electromagnetic interference (EMI) noise source impedance. On the basis of the impedance information extracted by traditional SP method, GA is adopted to optimise the impedance information by taking advantage of the fast convergence speed. The obtained values of the RCL parameter are used as a set of initial values. Then, by using the advantage of the high precision of the LM, the initial values obtained by the GA are iteratively calculated. Better results can be obtained by using this combination method. This method improves the processing accuracy while ensuring the processing speed and contributes to the design of conduction EMI filter.

中文翻译:

基于遗传算法和遗传算法的电磁兼容噪声传导模型在电磁兼容性分析中的应用研究

在这项研究中,提出了一种采用散射参数(SPs)方法,遗传算法(GA)和Levenberg–Marquardt算法(LM)的新方法来对传导电磁干扰(EMI)噪声源阻抗进行建模。在传统SP方法提取的阻抗信息的基础上,采用GA来利用快速收敛的速度对阻抗信息进行优化。获得的RCL参数的值用作一组初始值。然后,利用LM高精度的优势,迭代地计算出由GA获得的初始值。通过使用这种组合方法可以获得更好的结果。该方法在确保处理速度的同时提高了处理精度,并且有助于传导EMI滤波器的设计。
更新日期:2020-04-22
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