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A 180-nm X-Band Cryogenic CMOS LNA
IEEE Microwave and Wireless Components Letters ( IF 3 ) Pub Date : 2020-04-01 , DOI: 10.1109/lmwc.2020.2979341
Alican Caglar , Mustafa Berke Yelten

This letter presents the measurement results of a 180-nm complementary metal–oxide–semiconductor (CMOS) $X$ -band low-noise amplifier (LNA) at both 77 and 300 K. The designed LNA provides $S_{11}$ and $S_{22}$ below −10 dB at both temperatures within 6.4–7.4 GHz band. At 300 K, the voltage gain of the designed LNA is higher than 12.5 dB, and it provides an average noise temperature of 275 K, as well as −1 dBm IIP3. At 77 K, the LNA has approximately an 18-dB voltage gain, 78-K noise figure (NF), and −3 dBm IIP3. The presented work is the first implemented $X$ -band cryogenic CMOS LNA in the literature.

中文翻译:

180 纳米 X 波段低温 CMOS LNA

这封信展示了 180 nm 互补金属氧化物半导体 (CMOS) 的测量结果 $X$ 77 和 300 K 波段的低噪声放大器 (LNA)。设计的 LNA 提供 $S_{11}$ $S_{22}$ 在 6.4–7.4 GHz 频段内的两个温度下均低于 −10 dB。在 300 K 时,设计的 LNA 的电压增益高于 12.5 dB,并提供 275 K 的平均噪声温度和 -1 dBm IIP3。在 77 K 时,LNA 具有大约 18 dB 的电压增益、78-K 的噪声系数 (NF) 和 −3 dBm IIP3。所提出的工作是第一个实施的 $X$ 文献中的波段低温 CMOS LNA。
更新日期:2020-04-01
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