A parallel paper [Berujon, Cojocaru, Piault, Celestre, Roth, Barrett & Ziegler (2020), J. Synchrotron Rad.27, 284–292] reviewed theoretically some of the available processing schemes for X‐ray wavefront sensing based on random modulation. Shown here are experimental applications of the technique for characterizing both refractive and reflective optical components. These fast and accurate X‐ray at‐wavelength metrology methods can assist the manufacture of X‐ray optics that transport X‐ray beams with a minimum amount of wavefront distortion. It is also recalled how such methods can facilitate online optimization of active optics.

中文翻译：

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X射线光学和使用随机调制的光束表征：实验

平行论文[Berujon，Cojocaru，Piault，Celestre，Roth，Barrett＆Ziegler（2020），J。Synchrotron Rad。[ 27，284–292]从理论上回顾了一些基于随机调制的X射线波前传感的可用处理方案。此处显示的是用于表征折射和反射光学组件的技术的实验应用。这些快速准确的X射线波长计量方法可以帮助制造X射线光学器件，以最小的波前畸变传输X射线束。还回想起这样的方法如何能够促进有源光学器件的在线优化。