X‐ray fluorescence spectra of copper (Cu) metal, copper monoxide (CuO), and potassium chromate (K₂CrO₄) were recorded as a function of incident X‐ray energy near the Cu K‐edge and chromium (Cr) K‐edge, respectively, using a conventional silicon drift detector. The spectra contained components due to elastic, inelastic, and multiple scattering, in addition to the Kα and Kβ lines. Cu and Cr K‐edge X‐ray absorption fine structure (XAFS) spectra of Cu, CuO, and K₂CrO₄ were obtained by an intensity analysis of the Kα and Kβ lines. The intensity of the Kβ line for the different incident photon energies was obtained by numerically removing the additional scattering components using the MUSCAT program. These spectra exhibited a jump near the K absorption edges, which reproduced the spectral features obtained in transmission mode for both Cu, CuO, and K₂CrO₄. A chemical shift was also clearly identified in the X‐ray absorption near edges structure using the X‐ray fluorescence Kβ line. In addition, the Cr K‐edge extended XAFS spectrum of K₂CrO₄ was clearly observed using the Cr Kβ fluorescent line. The XAFS measurements on the Kα and Kβ lines are possible, and they carry equally valuable information.

中文翻译：

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使用常规能量区分检测器的X射线荧光Kβ线的XAFS光谱

记录了铜（Cu）金属，一氧化铜（CuO）和铬酸钾（K ₂ CrO ₄）的X射线荧光光谱随Cu K边缘和铬（Cr）K附近入射X射线能量的变化情况边缘，分别使用常规的硅漂移检测器。光谱除了包含Kα和Kβ线外，还包含由于弹性，非弹性和多重散射而产生的分量。Cu，CuO和K ₂ CrO _4的Cu和Cr K边缘X射线吸收精细结构（XAFS）光谱通过对Kα和Kβ线的强度分析获得。通过使用MUSCAT程序以数值方式去除其他散射分量，可以获得不同入射光子能量的Kβ线强度。这些光谱在K个吸收边缘附近表现出跳跃，这再现了对于Cu，CuO和K ₂ CrO ₄在透射模式下获得的光谱特征。还使用X射线荧光Kβ线在边缘结构附近的X射线吸收中清楚地确定了化学位移。此外，使用CrKβ荧光线可以清楚地观察到K ₂ CrO ₄的Cr K边缘扩展XAFS光谱。可以在Kα和Kβ线上进行XAFS测量，并且它们携带同等有价值的信息。