Cyclic fatigue resistance and energy dispersive X-ray spectroscopy analysis of novel heat-treated nickel-titanium instruments at body temperature.,Microscopy Research and Technique

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Cyclic fatigue resistance and energy dispersive X-ray spectroscopy analysis of novel heat-treated nickel-titanium instruments at body temperature.
Microscopy Research and Technique ( IF 2.0 ) Pub Date : 2020-03-14 , DOI: 10.1002/jemt.23469
Seniha Micoogullari Kurt ₁ , Mehmet Emin Kaval ₁ , Burcu Serefoglu ₁ , Gözde Kandemir Demirci ₁ , Mehmet Kemal Çalışkan ₁

Affiliation

The aim of this study was to evaluate the cyclic fatigue resistance of Dia‐X, WaveOne Gold and One Curve files in a water bath at intracanal temperature (35°C). Thirty‐nine instruments Dia‐X, WaveOne Gold, and One Curve systems (n = 13) were tested in an artificial canal with a curvature angle of 60° and a radius of 3 mm. A water bath setup at a temperature of 35°C was used to simulate the intracanal temperature and time to fracture (TTF) as seconds was recorded. The mean data were analyzed statistically using one‐way ANOVA, and post hoc Tukey test (p = .05). The fractured surface of the instruments was examined with scanning electron microscopy (SEM) and chemical composition of the instruments were investigated with energy dispersive X‐ray spectroscopy (EDS). Statistically significant differences were detected in TTF values of all the systems as follows: One Curve > WaveOne Gold > Dia‐X (p < .05). One Curve instruments demonstrated the highest TTF values in all the tested instruments. The EDS microanalysis revealed similar NiTi composition of on the surface of One Curve, WaveOne Gold, and Dia‐X instruments. The novel manufacturing process, including C‐wire heat treatment and the variable cross‐section of the One Curve files, could be the main factors affecting the fatigue life of the instruments.

中文翻译：

新型热处理镍钛仪器在体温下的循环疲劳强度和能量色散X射线光谱分析。

这项研究的目的是评估运河内温度（35°C）下水浴中Dia‐X，WaveOne Gold和One Curve文件的循环疲劳强度。在人造运河中测试了39台Dia-X，WaveOne Gold和One Curve系统（n = 13），其曲率角为60°，半径为3 mm。使用在35°C温度下设置的水浴来模拟运河内温度和破裂时间（TTF），以秒为单位。使用单因素方差分析和事后Tukey检验（p= .05）。通过扫描电子显微镜（SEM）检查仪器的断裂表面，并通过能量色散X射线光谱（EDS）研究仪器的化学成分。在所有系统的TTF值中检测到统计学上的显着差异，如下所示：一条曲线> WaveOne Gold> Dia-X（p <.05）。一台Curve仪器在所有测试仪器中均显示出最高的TTF值。EDS显微分析显示，One Curve，WaveOne Gold和Dia‐X仪器表面的NiTi成分相似。新颖的制造工艺（包括C线热处理和One Curve文件的可变横截面）可能是影响仪器疲劳寿命的主要因素。

更新日期：2020-03-14

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