This paper defines a new type of a low-power broadside test, called a reverse low-power broadside test, whose application requires design-for-testability logic. The unique feature of a reverse low-power broadside test is that it duplicates the switching activity during the second functional capture cycle of a given low-power broadside test, except that signal-transitions are reversed. Thus, the switching activity of a reverse low-power broadside test duplicates that of a low-power broadside test in every subcircuit and on every line individually. In addition, the reversed test detects different faults, and can thus increase the fault coverage of a low-power broadside test set. This paper studies the ability of reverse low-power broadside tests to increase the transition fault coverage in benchmark circuits considering functional broadside tests as well as low-power broadside tests that are not functional.

中文翻译：

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反向低功耗 Broadside 测试

本文定义了一种新型的低功耗横向测试，称为反向低功耗横向测试，其应用需要可测试性设计逻辑。反向低功率宽边测试的独特之处在于它在给定低功率宽边测试的第二个功能捕获周期期间复制开关活动，只是信号转换被反转。因此，反向低功率宽边测试的开关活动与每个子电路和每条线路上的低功率宽边测试的开关活动重复。此外，反向测试检测不同的故障，因此可以增加低功耗宽边测试集的故障覆盖率。